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"Pseudo-Exhaustive Testing of Sequential Circuits."

Bassam Shaer, Sami A. Al-Arian, David L. Landis (1999)

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DOI: 10.1109/GLSV.1999.757388

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/glvlsi/ShaerAL99
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  persistent URL:
  - https://dblp.org/rec/conf/glvlsi/ShaerAL99
Bassam Shaer, Sami A. Al-Arian, David L. Landis:
Pseudo-Exhaustive Testing of Sequential Circuits. Great Lakes Symposium on VLSI 1999: 109-

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