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"DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs."

Guilherme Cardoso Medeiros et al. (2019)

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DOI: 10.1109/ETS.2019.8791517

access: closed

type: Conference or Workshop Paper

metadata version: 2020-09-05

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  dblp key:
  - conf/ets/MedeirosTFPH19
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  - https://dblp.org/rec/conf/ets/MedeirosTFPH19
Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui:
DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs. ETS 2019: 1-2

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