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"Internal photoemission technique for high-k oxide/semiconductor band ..."

Olof Engström et al. (2014)

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DOI: 10.1109/ESSDERC.2014.6948837

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-15

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  - conf/essderc/EngstromPMH14
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Olof Engström, Henryk M. Przewlocki, Ivona Z. Mitrovic, Stephen Hall:
Internal photoemission technique for high-k oxide/semiconductor band offset determination: The influence of semiconductor bulk properties. ESSDERC 2014: 369-372

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