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"Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one ..."

Simon Van Beek et al. (2018)

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DOI: 10.1109/ESSDERC.2018.8486879

access: closed

type: Conference or Workshop Paper

metadata version: 2018-12-18

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  - conf/essderc/BeekRODCLK18
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Simon Van Beek, Philippe Roussel, Barry J. O'Sullivan, Robin Degraeve, Stefan Cosemans, Dimitri Linten, Gouri Sankar Kar:
Study of breakdown in STT-MRAM using ramped voltage stress and all-in-one maximum likelihood fit. ESSDERC 2018: 146-149

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