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"Transient analysis of EM radiation associated with information leakage ..."

Yu-ichi Hayashi et al. (2013)

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DOI: 10.1109/EMCCOMPO.2013.6735177

access: closed

type: Conference or Workshop Paper

metadata version: 2019-06-12

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  - conf/emccompo/HayashiHAOA13
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  - https://dblp.org/rec/conf/emccompo/HayashiHAOA13
Yu-ichi Hayashi, Naofumi Homma, Takafumi Aoki, Yuichiro Okugawa, Yoshiharu Akiyama:
Transient analysis of EM radiation associated with information leakage from cryptographic ICs. EMC Compo 2013: 78-82

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