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"Defect characterization of InAs/InGaAs quantum dot photodetector grown on ..."

Jian Huang et al. (2019)

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DOI: 10.1109/DRC46940.2019.9046450

access: closed

type: Conference or Workshop Paper

metadata version: 2020-04-03

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  - conf/drc/HuangWJNSLLG0C19
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  - https://dblp.org/rec/conf/drc/HuangWJNSLLG0C19
Jian Huang, Yating Wan, Daehwan Jung, Justin Norman, Chen Shang, Qiang Li, Kei May Lau, Arthur C. Gossard, John E. Bowers, Baile Chen:
Defect characterization of InAs/InGaAs quantum dot photodetector grown on GaAs-on-V-grooved-Si substrate. DRC 2019: 165-166

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