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"A Schematic-Based Extraction Methodology for Dislocation Defects in ..."
Nivesh Rai et al. (2011)
- Nivesh Rai, Hamidreza Hashempour, Yizi Xing, Bram Kruseman, Said Hamdioui:
A Schematic-Based Extraction Methodology for Dislocation Defects in Analog/Mixed-Signal Devices. DFT 2011: 139-145
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