"A Partial Scan Based Test Generation for Asynchronous Circuits."

Dilip P. Vasudevan, Aristides Efthymiou (2008)

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DOI: 10.1109/DDECS.2008.4538783

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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Dilip P. Vasudevan, Aristides Efthymiou:
A Partial Scan Based Test Generation for Asynchronous Circuits. DDECS 2008: 186-189

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