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"Diagnosis of Realistic Defects Based on the X-Fault Model."

Ilia Polian et al. (2008)

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DOI: 10.1109/DDECS.2008.4538798

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/ddecs/PolianMNKEBSW08
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  persistent URL:
  - https://dblp.org/rec/conf/ddecs/PolianMNKEBSW08
Ilia Polian, Kohei Miyase, Yusuke Nakamura, Seiji Kajihara, Piet Engelke, Bernd Becker, Stefan Spinner, Xiaoqing Wen:
Diagnosis of Realistic Defects Based on the X-Fault Model. DDECS 2008: 263-266

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