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ORCID"Built-In Current Monitor for IDDQ Testing in CMOS 90 nm Technology."
Marcin J. Beresinski et al. (2008)
- Marcin J. Beresinski, Tomasz Borejko, Witold A. Pleskacz, Viera Stopjaková
:
Built-In Current Monitor for IDDQ Testing in CMOS 90 nm Technology. DDECS 2008: 259-262
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