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"Fast Sequential Circuit Test Generation Using High-Level and Gate-Level ..."

Elizabeth M. Rudnick et al. (1998)

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DOI: 10.1109/DATE.1998.655915

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/date/RudnickVECPR98
Elizabeth M. Rudnick, Roberto Vietti, Akilah Ellis, Fulvio Corno, Paolo Prinetto, Matteo Sonza Reorda:
Fast Sequential Circuit Test Generation Using High-Level and Gate-Level Techniques. DATE 1998: 570-576

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