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"Interactive presentation: Automatic test pattern generation for maximal ..."

Kunal P. Ganeshpure, Sandip Kundu (2007)

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DOI: 10.1109/DATE.2007.364649

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/date/GaneshpureK07
Kunal P. Ganeshpure, Sandip Kundu:
Interactive presentation: Automatic test pattern generation for maximal circuit noise in multiple aggressor crosstalk faults. DATE 2007: 540-545

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