"Modeling local variation of low-frequency noise in MOSFETs via sum of ..."

Bo Yu et al. (2012)

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DOI: 10.1109/CICC.2012.6330573

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Bo Yu, Xin Li, James Yonemura, Zhiyuan Wu, Jung-Suk Goo, Ciby Thuruthiyil, Ali Icel:
Modeling local variation of low-frequency noise in MOSFETs via sum of lognormal random variables. CICC 2012: 1-4

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