"Adaptive Low Shift Power Test Pattern Generator for Logic BIST."

Xijiang Lin, Janusz Rajski (2010)

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DOI: 10.1109/ATS.2010.67

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Xijiang Lin, Janusz Rajski:
Adaptive Low Shift Power Test Pattern Generator for Logic BIST. Asian Test Symposium 2010: 355-360

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