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"Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to ..."

Jae Chul Cha, Sandeep K. Gupta (2011)

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DOI: 10.1109/ATS.2011.71

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-26

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Jae Chul Cha, Sandeep K. Gupta:
Yield-per-Area Optimization for 6T-SRAMs Using an Integrated Approach to Exploit Spares and ECC to Efficiently Combat High Defect and Soft-Error Rates. Asian Test Symposium 2011: 126-135

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