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"Functional testing and fault analysis based fault coverage enhancement ..."

Ameet Bagwe, Rubin A. Parekhji (2000)

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DOI: 10.1109/ATS.2000.893635

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ameet Bagwe, Rubin A. Parekhji:
Functional testing and fault analysis based fault coverage enhancement techniques for embedded core based systems. Asian Test Symposium 2000: 260-

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