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"Accelerating electromigration aging for fast failure detection for ..."

Zeyu Sun et al. (2018)

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DOI: 10.1109/ASPDAC.2018.8297392

access: closed

type: Conference or Workshop Paper

metadata version: 2021-02-19

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/aspdac/SunSZT18
Zeyu Sun, Sheriff Sadiqbatcha, Hengyang Zhao, Sheldon X.-D. Tan:
Accelerating electromigration aging for fast failure detection for nanometer ICs. ASP-DAC 2018: 623-630

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