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"Combining GAs and Symbolic Methods for High Quality Tests of Sequential ..."

Martin Keim, Nicole Drechsler, Bernd Becker (1999)

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DOI: 10.1109/ASPDAC.1999.760022

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/aspdac/KeimDB99
Martin Keim, Nicole Drechsler, Bernd Becker:
Combining GAs and Symbolic Methods for High Quality Tests of Sequential Circuits. ASP-DAC 1999: 315-318

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