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"Efficient circuit failure probability calculation along product lifetime ..."

Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato (2017)

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DOI: 10.1109/ASPDAC.2017.7858302

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Hiromitsu Awano, Masayuki Hiromoto, Takashi Sato:
Efficient circuit failure probability calculation along product lifetime considering device aging. ASP-DAC 2017: 93-98

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