"A temperature-stabilized voltage reference utilizing MOS body effect."

Haesick Sul, Young-Hyun Jun, Bai-Sun Kong (2010)

Details and statistics

DOI: 10.1109/APCCAS.2010.5774965

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

a service of  Schloss Dagstuhl - Leibniz Center for Informatics