Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Statistical Performance Analysis and Modeling Techniques for Nanometer ..."

Ruijing Shen, Sheldon X.-D. Tan, Hao Yu (2012)

> Home

Details and statistics

DOI: 10.1007/978-1-4614-0788-1

access: closed

type: Book or Thesis

metadata version: 2018-04-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - books/daglib/0035475
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/books/daglib/0035475
Ruijing Shen, Sheldon X.-D. Tan, Hao Yu:
Statistical Performance Analysis and Modeling Techniques for Nanometer VLSI Designs. Springer 2012, ISBN 978-1-4614-0787-4, pp. I-XXIX, 1-305

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.