"Focus and Motion Blur in Microscopy (FaMM)."

Patrick Krawczyk et al. (2024)

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DOI: 10.21227/VWRX-YW83

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type: Data or Artifact

metadata version: 2024-08-27

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Patrick Krawczyk, Andreas Jansche, Timo Bernthaler, Gerhard Schneider:
Focus and Motion Blur in Microscopy (FaMM). IEEE DataPort, 2024

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