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"JExample: Exploiting Dependencies between Tests to Improve Defect ..."
Adrian Kuhn et al. (2008)
- Adrian Kuhn, Bart Van Rompaey, Lea Haensenberger, Oscar Nierstrasz, Serge Demeyer, Markus Gälli, Koenraad Van Leemput:
JExample: Exploiting Dependencies between Tests to Improve Defect Localization. XP 2008: 73-82
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