"Skipping algorithms for defect inspection using a dynamic control strategy ..."

Gloria Luz Rodríguez-Verján et al. (2013)

> Home

Details and statistics

DOI: 10.1109/WSC.2013.6721729

access: closed

type: Conference or Workshop Paper

metadata version: 2021-06-10

- view
  authority control:
- export record
  dblp key:
  - conf/wsc/Rodriguez-VerjanDHP13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/wsc/Rodriguez-VerjanDHP13
Gloria Luz Rodríguez-Verján, Stéphane Dauzère-Pérès, Sylvain Housseman, Jacques Pinaton:
Skipping algorithms for defect inspection using a dynamic control strategy in semiconductor manufacturing. WSC 2013: 3684-3695

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.