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"Dynamic Sampling for Risk Minimization in Semiconductor Manufacturing."
Étienne Le Quéré et al. (2020)
- Étienne Le Quéré, Stéphane Dauzère-Pérès, Karim Tamssaouet, Cédric Maufront, Stéphane Astie:
Dynamic Sampling for Risk Minimization in Semiconductor Manufacturing. WSC 2020: 1886-1897
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