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"General-purpose image forensics using patch likelihood under image ..."

Wei Fan, Kai Wang, François Cayre (2015)

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DOI: 10.1109/WIFS.2015.7368606

access: closed

type: Conference or Workshop Paper

metadata version: 2018-06-12

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Wei Fan, Kai Wang, François Cayre:
General-purpose image forensics using patch likelihood under image statistical models. WIFS 2015: 1-6

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