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"Thermal-uniformity-aware X-filling to reduce temperature-induced delay ..."

Tomokazu Yoneda et al. (2010)

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DOI: 10.1109/VTS.2010.5469578

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Tomokazu Yoneda, Michiko Inoue, Yasuo Sato, Hideo Fujiwara:
Thermal-uniformity-aware X-filling to reduce temperature-induced delay variation for accurate at-speed testing. VTS 2010: 188-193

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