"High accelerated lifetime test methods and procedures for VLSI ..."

E. Weis et al. (1991)

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DOI: 10.1109/VTEST.1991.208144

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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E. Weis, E. Kinsbron, G. Chanoch, M. Snyder:
High accelerated lifetime test methods and procedures for VLSI microcircuit interconnection line certification. VTS 1991: 114-117

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