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"Predicting Vt mean and variance from parallel Id measurement with ..."
Chih-Ying Tsai et al. (2016)
- Chih-Ying Tsai, Kao-Chi Lee, Chien-Hsueh Lin, Sung-Chu Yu, Wen-Rong Liau, Alex Chun-Liang Hou, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Mango C.-T. Chao:
Predicting Vt mean and variance from parallel Id measurement with model-fitting technique. VTS 2016: 1-6
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