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"Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing."

Iboun Taimiya Sylla et al. (1998)

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DOI: 10.1109/VTEST.1998.670875

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/SyllaSKHV98
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  persistent URL:
  - https://dblp.org/rec/conf/vts/SyllaSKHV98
Iboun Taimiya Sylla, Mustapha Slamani, Bozena Kaminska, Fartoumi M. Hossein, Patrick Vincent:
Impedance Mismatch and Lumped Capacitance Effects in High Frequency Testing. VTS 1998: 239-244

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