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"Innovative practices session 7C: Reduced pin-count testing - How low can ..."

Stephen K. Sunter et al. (2014)

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DOI: 10.1109/VTS.2014.6818778

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/SunterCBR14
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  persistent URL:
  - https://dblp.org/rec/conf/vts/SunterCBR14
Stephen K. Sunter, Steve Comen, Paul Berndt, Ram Rajamani:
Innovative practices session 7C: Reduced pin-count testing - How low can we go? VTS 2014: 1

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