"Test Power Reduction through Minimization of Scan Chain Transitions."

Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu (2002)

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DOI: 10.1109/VTS.2002.1011129

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu:
Test Power Reduction through Minimization of Scan Chain Transitions. VTS 2002: 166-172

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