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"Too many faults, too little time on creating test sets for enhanced ..."

Yiwen Shi, Wan-Chan Hu, Jennifer Dworak (2010)

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DOI: 10.1109/VTS.2010.5469545

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Yiwen Shi, Wan-Chan Hu, Jennifer Dworak:
Too many faults, too little time on creating test sets for enhanced detection of highly critical faults and defects. VTS 2010: 319-324

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