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"Detection of gate-oxide defects with timing tests at reduced power supply."

Xi Qian, Chao Han, Adit D. Singh (2012)

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DOI: 10.1109/VTS.2012.6231090

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  dblp key:
  - conf/vts/QianHS12
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  - https://dblp.org/rec/conf/vts/QianHS12
Xi Qian, Chao Han, Adit D. Singh:
Detection of gate-oxide defects with timing tests at reduced power supply. VTS 2012: 120-126

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