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"On Maximizing the Fault Coverage for a Given Test Length Limit in a ..."

Irith Pomeranz, Sudhakar M. Reddy (2003)

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DOI: 10.1109/VTEST.2003.1197648

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
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  persistent URL:
  - https://dblp.org/rec/conf/vts/PomeranzR03
Irith Pomeranz, Sudhakar M. Reddy:
On Maximizing the Fault Coverage for a Given Test Length Limit in a Synchronous Sequential Circuit. VTS 2003: 173-178

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