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"Limitations in predicting defect level based on stuck-at fault coverage."

Jaehong Park et al. (1994)

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DOI: 10.1109/VTEST.1994.292315

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/ParkNKMW94
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  persistent URL:
  - https://dblp.org/rec/conf/vts/ParkNKMW94
Jaehong Park, Mark Naivar, Rohit Kapur, M. Ray Mercer, Thomas W. Williams:
Limitations in predicting defect level based on stuck-at fault coverage. VTS 1994: 186-191

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