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"Reconfiguration Technique for Reducing Test Time and Test Data Volume in ..."

Amit R. Pandey, Janak H. Patel (2002)

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DOI: 10.1109/VTS.2002.1011104

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/PandeyP02
Amit R. Pandey, Janak H. Patel:
Reconfiguration Technique for Reducing Test Time and Test Data Volume in Illinois Scan Architecture Based Designs . VTS 2002: 9-15

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