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"Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a ..."

Renjian Pan et al. (2019)

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DOI: 10.1109/VTS.2019.8758639

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-03

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Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model. VTS 2019: 1-6

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