"A Method of Test Generation for Path Delay Faults in Balanced Sequential ..."

Satoshi Ohtake, Hideo Fujiwara, Shunjiro Miwa (2002)

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DOI: 10.1109/VTS.2002.1011160

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Satoshi Ohtake, Hideo Fujiwara, Shunjiro Miwa:
A Method of Test Generation for Path Delay Faults in Balanced Sequential Circuits. VTS 2002: 321-327

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