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"Signal Integrity Problems in Deep Submicron Arising from Interconnects ..."

Petra Nordholz et al. (1998)

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DOI: 10.1109/VTEST.1998.670845

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/NordholzTOGNW98
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  - https://dblp.org/rec/conf/vts/NordholzTOGNW98
Petra Nordholz, Dieter Treytnar, Jan Otterstedt, Hartmut Grabinski, Dirk Niggemeyer, T. W. Williams:
Signal Integrity Problems in Deep Submicron Arising from Interconnects between Cores. VTS 1998: 28-33

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