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"Machine Learning-Based Overkill Reduction through Inter-Test Correlation."

Deepika Neethirajan et al. (2022)

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DOI: 10.1109/VTS52500.2021.9794170

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/vts/NeethirajanNWNW22
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  - https://dblp.org/rec/conf/vts/NeethirajanNWNW22
Deepika Neethirajan, V. A. Niranjan, Richard Willis, Amit Nahar, D. Webster, Yiorgos Makris:
Machine Learning-Based Overkill Reduction through Inter-Test Correlation. VTS 2022: 1-7

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