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"MBIST-based Trim-Search Test Time Reduction for STT-MRAM."

Christopher Münch et al. (2022)

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DOI: 10.1109/VTS52500.2021.9794178

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-22

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  dblp key:
  - conf/vts/MunchYKT22
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  persistent URL:
  - https://dblp.org/rec/conf/vts/MunchYKT22
Christopher Münch, Jongsin Yun, Martin Keim, Mehdi B. Tahoori:
MBIST-based Trim-Search Test Time Reduction for STT-MRAM. VTS 2022: 1-7

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