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"On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and ..."

Seyed Nima Mozaffari et al. (2022)

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DOI: 10.1109/VTS52500.2021.9794251

access: closed

type: Conference or Workshop Paper

metadata version: 2022-06-28

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  - conf/vts/MozaffariBSSFVM22
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  - https://dblp.org/rec/conf/vts/MozaffariBSSFVM22
Seyed Nima Mozaffari, Bonita Bhaskaran, Shantanu Sarangi, Suhas M. Satheesh, Kuo Lin Fu, Nithin Valentine, P. Manikandan, Mahmut Yilmaz:
On-Die Noise Measurement During Automatic Test Equipment (ATE) Testing and In-System-Test (IST). VTS 2022: 1-6

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