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"Multi-channel testing architecture for high-speed eye-diagram using pin ..."

Thomas Moon et al. (2014)

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DOI: 10.1109/VTS.2014.6818768

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  dblp key:
  - conf/vts/MoonCKC14
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  persistent URL:
  - https://dblp.org/rec/conf/vts/MoonCKC14
Thomas Moon, Hyun Woo Choi, David C. Keezer, Abhijit Chatterjee:
Multi-channel testing architecture for high-speed eye-diagram using pin electronics and subsampling monobit reconstruction algorithms. VTS 2014: 1-6

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