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"Special Session - Test for AI Chips: from DFT to On-line Testing."

Huawei Li et al. (2021)

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DOI: 10.1109/VTS50974.2021.9441057

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-11

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  dblp key:
  - conf/vts/LiL0WG21
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  - https://dblp.org/rec/conf/vts/LiL0WG21
Huawei Li, Xiaowei Li, Yu Huang, Ying Wang, Gary Guo:
Special Session - Test for AI Chips: from DFT to On-line Testing. VTS 2021: 1

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