"Characterization and All-Region Virtual-Source Modeling of 40 nm GaN HEMT ..."

Kexin Li et al. (2025)

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DOI: 10.1109/VTS65138.2025.11022847

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-23

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Kexin Li, Armagan Dascurcu, Hari Vemuri, Harish Krishnaswamy:
Characterization and All-Region Virtual-Source Modeling of 40 nm GaN HEMT Technology for High Frequency IC Design. VTS 2025: 1-5

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