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"Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects."

Somayeh Sadeghi Kohan, Sybille Hellebrand (2020)

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DOI: 10.1109/VTS48691.2020.9107591

access: closed

type: Conference or Workshop Paper

metadata version: 2020-06-25

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  dblp key:
  - conf/vts/KohanH20
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  - https://dblp.org/rec/conf/vts/KohanH20
Somayeh Sadeghi Kohan, Sybille Hellebrand:
Dynamic Multi-Frequency Test Method for Hidden Interconnect Defects. VTS 2020: 1-6

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