"A partial scan methodology for testing self-timed circuits."

Ajay Khoche, Erik Brunvand (1995)

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DOI: 10.1109/VTEST.1995.512650

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Ajay Khoche, Erik Brunvand:
A partial scan methodology for testing self-timed circuits. VTS 1995: 283-289

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