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"Bit line coupling memory tests for single-cell fails in SRAMs."

Sandra Irobi, Zaid Al-Ars, Said Hamdioui (2010)

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DOI: 10.1109/VTS.2010.5469624

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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  - conf/vts/IrobiAH10
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Sandra Irobi, Zaid Al-Ars, Said Hamdioui:
Bit line coupling memory tests for single-cell fails in SRAMs. VTS 2010: 27-32

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