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"A Test Generation Method Using a Compacted Test Table and a Test ..."

Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka (2002)

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DOI: 10.1109/VTS.2002.1011161

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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  - https://dblp.org/rec/conf/vts/HosokawaDM02
Toshinori Hosokawa, Hiroshi Date, Michiaki Muraoka:
A Test Generation Method Using a Compacted Test Table and a Test Generation Method Using a Compacted Test Plan Table for RTL Data Path Circuits. VTS 2002: 328-335

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